By Julio Gómez
ESI Special Topics,
November 2006
Citing URL - http://www.esi-topics.com/nhp/2006/november-06-JulioGomez.html
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Julio Gómez
answers a few questions about this month's
new hot paper in the field of Materials Science.
The author has also
sent along images of their work.
From
•>>November 2006
Field:
Materials Science
Article Title: Tuning the conductance of single-walled carbon nanotubes by ion irradiation in the Anderson localization regime
Authors: Gomez-Navarro,
C;De Pablo, PJ;Gomez-Herrero, J;Biel,
B;Garcia-Vidal, FJ;Rubio, A;Flores, F
Journal: NAT MATER
Volume: 4
Issue: 7
Page: 534-539
Year: JUL 2005
* Univ Autonoma Madrid, Dept Fis Mat Condensada,
Cantoblanco, E-28049 Madrid, Spain.
* Univ Autonoma Madrid, Dept Fis Mat Condensada, E-28049 Madrid, Spain.
* Univ Autonoma Madrid, Dept Fis Teor Mat Condensada, E-28049 Madrid, Spain.
* Univ Pais Vasco UPV EHU, Dept Fis Mat, E-20018 San Sebastian, Spain.
* Donostia Int Phys Ctr, E-20018 San Sebastian, Spain.
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Why
do you think your paper is highly cited?
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“Any electronic circuit uses electrical resistances of different values, therefore it would be very nice to be able to implement a method to control the electrical resistance of carbon nanotubes for further uses in electronic circuits.”
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Because it addressed two different problems: one fundamental that
is Anderson Localization and one applied that is the possibility to
tune the resistance of carbon nanotubes by ion irradiation.
Does
it describe a new discovery, methodology, or synthesis of knowledge?
It describes a new methodology to control the electrical
resistance of single-walled carbon nanotubes by introducing defects
using Ar+ ion irradiation. In addition, our result
demonstrates that, in the presence of defects, the electronic
transport at low voltage is in the Anderson localization regime.
Could
you summarize the significance of your paper in layman’s terms?
Carbon nanotubes are expected to be the fundamental components of
so-called molecular electronics. Any electronic circuit uses
electrical resistances of different values; therefore it would be
very nice to be able to implement a method to control the electrical
resistance of carbon nanotubes for further uses in electronic
circuits. This has been demonstrated to be possible by using Ar+
ions to irradiate the nanotubes and create defects along their
length.
In addition to this applied idea, there is a fundamental
implication in the work published in Nature Materials: the
so-called Anderson localization regime. In a macroscopic conductor,
let’s say a copper wire, the electrical resistance changes
linearly with the length of the wire.
Carbon nanotubes are a good approximation of a one-dimensional
conductor, in addition at voltages smaller that 0.3 V the
electron-phonon coupling is very weak and then the electrons behave
as waves traveling along the nanotube. When these waves scatter with
the defects created by ion irradiation the result is a complex
interference which gives rise to the so called Anderson
Localization.
One of the consequences of this electronic transport regime is
that the resistance vs. length dependence along the nanotube is not
linear, as in a classical conductor, but exponential. Our
experiments show this exponential dependence, as would be expected
from theoretical predictions.
How
did you become involved in this research, and were there obstacles
along the way?
I was working in the field of carbon nanotubes for seven years.
In particular, I was interested in measuring the electrical
resistance of a carbon nanotube as a function of its length, using
conductance atomic force microscopy. Then, I got the idea of
inducing vacancies with Ar+ ions and controlling the
electrical resistance of the nanotube by control of the irradiation
dose.
Dr. Julio Gómez-Herrero
Departamento de Física de la Materia Condensada
Universidad Autónoma de Madrid
Madrid, Spain
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A Closer Look...
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Below
are images sent in by Julio Gómez which correspond with the featured
paper, or current research. |
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Figure 1:

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Figure 2:

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Figure 3:

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ESI Special Topics,
November 2006
Citing URL - http://www.esi-topics.com/nhp/2006/november-06-JulioGomez.html
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